ION-TOF GmbH

ION-TOF GmbH is the leading European supplier of time-of-flight secondary ion mass spectrometry (TOF-SIMS) and high-sensitivity low energy ion scattering (LEIS).

The company was founded by Prof. Alfred Benninghoven, Dr. Ewald Niehuis and Mr Thomas Heller as a spin-off of the University of Muenster in 1989 in order to commercialize the original research. Meanwhile, ION-TOF has become an established supplier in the field of surface analysis. Its development is seen as a role model for the successful transfer of technology.

Since its establishment, ION-TOF has continuously been working on extending the fields of application. With more than 190 instruments installed world-wide, the company is the preferred partner for the industrial and academic use of the equipment it provides.

Technical capability, performance, excellent after sales service and a deep understanding of the customers’ needs regarding modern surface analysis are the basis of ION-TOF’s success.